The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...

The JEOL JSM IT500 scanning electron microscope (SEM) is used for high-resolution imaging and qualitative X-ray microanalysis of conductive and non-conductive samples at a magnification range between ...

JEOL produced its first electron microscope in 1949, the year of the company’s establishment. Today, under the philosophy of aiming for the world’s most advanced technologies based on creative ...

The Electron and Scanning Probe Microscopy Unit provides solutions for imaging and analysis at the nanoscale ... dispersive X-ray systems for analysis of elemental composition and distribution. The ...

grant by NSF in Summer 2014 to purchase a new electron microprobe, a JEOL JXA-8230 equipped with LaB6 electron gun (PIs K.H. Mahan, J.M. Allaz, and G.L. Farmer). This new instrument will replace the ...

The JEOL TEM-F200 is a 200kV S/TEM equipped with a Cold Field Emission Gun for high brightness and a narrow energy spread, supporting high energy resolution electron energy loss spectroscopy (EELS).

Our transmission electron microscope is a JEOL JSM-2000EX. The JSM 2000EX has an accelerating voltage of 80-200 kV. This instrument has a lattice image resolution of 0.14nm and a point image ...

2 scanning electron microscopes (SEM), 2 transmission electron microscopes (TEM), 2 laser scanning confocal microscopes,1 deconvolution light microscope, 1 wide-field multimode light microscope, and 1 ...

Scanning Electron Microscope (SEM) and Electron Probe Microanalyzer (EPMA ... Our new NSF-funded field-emission EPMA (JEOL JXA iHP200F) was the first to be installed in the U.S. and is equipped with 5 ...